NanoScope Analysis 3.00

NanoScope Analysis is a specialized application for viewing, processing, and quantifying data from atomic force microscopy (AFM) and related scanning probe techniques. Designed around native NanoScope file formats, it helps researchers transform raw scans into reliable measurements and publication-ready visuals.

Key capabilities include:

• Support for multi-channel AFM datasets, including topography, phase, amplitude, electrical and mechanical property maps, and force curves/force-volume data.
• Image correction and cleanup tools such as plane leveling, line-by-line flattening, background subtraction, line-scar removal, and noise filtering.
• Quantitative analysis of surface metrics: roughness (e.g., Ra, Rq), height distributions, bearing ratio, step height, grain/particle statistics, and FFT-based texture assessment.
• Cross-sections, line profiles, histograms, and interactive 3D rendering for detailed inspection and presentation.
• Force spectroscopy analysis for contact point, adhesion, stiffness, and modulus using common contact models (e.g., Hertz/DMT), including support for property-mapping modes such as PeakForce QNM.
• Export of high-quality images and data tables to standard formats (e.g., TIFF/PNG, CSV/ASCII) with preservation of relevant metadata.

Widely used in materials science, polymers, semiconductors, and life sciences, NanoScope Analysis streamlines AFM data workflows—from initial visualization and artifact correction to robust quantitative reporting.

NanoScope Analysis is developed by Veeco Instruments Inc. and is used by 2 users of Software Informer. The most popular version of this product among our users is 3.0. The names of program executable files are NanoScopeAnalysis.exe, NanoScope_Analysis_x86_v180r1.exe and VeecoDataAnalysis.exe.